A method for optimizing a slice orientation for an examination using a magnetic resonance machine is provided. One or more device limitation of the magnetic resonance machine is provided. The device limitation includes, for at least one of the one or more gradient axes, a maximum gradient strength and/or a maximum gradient slew rate. At least one measurement parameter value of the examination and an original slice orientation are also provided. Rotational-angle information is determined from device limitations, measurement parameter values, and the original slice orientation. The rotational-angle information is used to optimize the original slice orientation, and the magnetic resonance machine captures measurement data on the basis of the optimized slice orientation.