Electroabsorption modulator for depth imaging and other applications
Abstract:
A TOF depth imaging system for providing a depth image of an object is provided comprising a light source configured to illuminate an object with amplitude modulated light characterized by a wavelength λ and a modulation frequency f, a surface-normal electroabsorption modulator configured to receive and to modulate reflected light from the object with the modulation frequency f, and an image sensor configured to receive and to detect modulated reflected light from the electroabsorption modulator. The electroabsorption modulator comprises a top doped layer of semiconductor, a bottom doped layer of semiconductor having opposite polarity to the top doped layer, and an active layer between the top and bottom doped layers, the active layer configured as a superlattice structure comprising multiple sublayers of semiconductor configured to provide alternating quantum wells and barriers, the active layer comprising quantum wells configured to exhibit delocalized electron-hole behavior.
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