Invention Grant
- Patent Title: Observation method using microscopic imaging device
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Application No.: US14811067Application Date: 2015-07-28
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Publication No.: US10254527B2Publication Date: 2019-04-09
- Inventor: Soichiro Ueno
- Applicant: Kabushiki Kaisha Toshiba
- Applicant Address: JP Minato-ku
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Minato-ku
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2014-156706 20140731
- Main IPC: G02B21/00
- IPC: G02B21/00 ; G02B21/36 ; G02B27/00 ; G02B21/34 ; H01L27/146 ; G01N21/64 ; B01L3/00 ; G02B13/24 ; G02B3/00

Abstract:
A certain embodiment provides an observation method using a microscopic imaging device which has a solid-state imaging device having a plurality of pixels arranged at predetermined intervals, each of the pixels including a microlens configured to collect light, and a light receiving unit configured to receive the light collected by the microlens. The observation method includes mounting an object to be observed on the microlenses or above the microlenses by disposing a specimen containing the object to be observed on the microscopic imaging device, and imaging the object to be observed, mounted on the microlenses or above the microlenses by a solid-state imaging device.
Public/Granted literature
- US20160033751A1 OBSERVATION METHOD USING MICROSCOPIC IMAGING DEVICE Public/Granted day:2016-02-04
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