Invention Grant
- Patent Title: Crystal oscillator device and method of measuring crystal oscillator characteristic
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Application No.: US15581908Application Date: 2017-04-28
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Publication No.: US10256771B2Publication Date: 2019-04-09
- Inventor: Masakazu Kishi , Hajime Kubota , Masayuki Itoh , Yoshinori Mesaki
- Applicant: FUJITSU LIMITED
- Applicant Address: JP Kawasaki
- Assignee: FUJITSU LIMITED
- Current Assignee: FUJITSU LIMITED
- Current Assignee Address: JP Kawasaki
- Agency: Fujitsu Patent Center
- Priority: JP2016-116460 20160610
- Main IPC: H03B5/32
- IPC: H03B5/32 ; H03H9/19 ; H01L41/04 ; H01L41/09 ; H03B5/36

Abstract:
A crystal oscillator device is disclosed. The crystal oscillator device includes a crystal piece provided in a casing; a pair of excitation electrodes provided for the crystal piece; a coil provided on the crystal piece; a magnetic flux generating member configured to generate magnetic flux passing through the coil; and an alarm generator configured to generate an alarm based on a signal whose amplitude is equal to or less than a reference value, the signal being generated in the coil.
Public/Granted literature
- US20170359026A1 CRYSTAL OSCILLATOR DEVICE AND METHOD OF MEASURING CRYSTAL OSCILLATOR CHARACTERISTIC Public/Granted day:2017-12-14
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