Invention Grant
- Patent Title: Quality inspection data distributed ledger
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Application No.: US16031956Application Date: 2018-07-10
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Publication No.: US10257496B2Publication Date: 2019-04-09
- Inventor: Raf Peeters , Bert Peelaers
- Applicant: Qcify Inc.
- Applicant Address: US CA San Mateo
- Assignee: Qcify Inc.
- Current Assignee: Qcify Inc.
- Current Assignee Address: US CA San Mateo
- Agency: Imperium Patent Works LLP
- Agent Mark D. Marrello
- Main IPC: H04N13/243
- IPC: H04N13/243 ; G06T7/00 ; H04N5/232 ; H04N13/254 ; H04N5/247 ; H04N5/225

Abstract:
A method for generating a quality inspection data block for a distributed ledger includes: determining an identification code associated with a sample to be inspected, inspecting the sample and thereby generating quality inspection data associated with the sample, and after completion of the inspecting of the sample combining the identification code and the quality inspection data into the quality inspection data block. The method also includes adding the quality inspection data block to the distributed ledger. An inspector including a sensor that senses a characteristic of a sample, a memory that stores sensor output data, and a processor configured to: determine an identification code associated with a sample to be inspected, generate quality inspection data based on the sensor output data, and combine the identification code and the quality inspection data into a quality inspection data block. In one example, the inspector is an in-flight 3D inspector.
Public/Granted literature
- US20180324407A1 QUALITY INSPECTION DATA DISTRIBUTED LEDGER Public/Granted day:2018-11-08
Information query