Invention Grant
- Patent Title: Non-contact measurement device for radius of curvature and thickness of lens and measurement method thereof
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Application No.: US16007439Application Date: 2018-06-13
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Publication No.: US10260988B2Publication Date: 2019-04-16
- Inventor: Wei-Yao Hsu , Wei-Jei Peng , Zong-Ru Yu , Jung-Hsin Wang , Po-Jui Chen , Cheng-Fang Ho , Chi-Hung Huang , Chun-Cheng Chen , Hua-Lin Chen , Yi-Hao Lin , Ming-Fu Chen
- Applicant: NATIONAL APPLIED RESEARCH LABORATORIES
- Applicant Address: TW Taipei
- Assignee: NATIONAL APPLIED RESEARCH LABORATORIES
- Current Assignee: NATIONAL APPLIED RESEARCH LABORATORIES
- Current Assignee Address: TW Taipei
- Agency: Muncy, Geissler, Olds & Lowe, P.C.
- Priority: TW106119593A 20170613
- Main IPC: G01B9/00
- IPC: G01B9/00 ; G01M11/02

Abstract:
The present disclosure illustrates a non-contact measurement device for a radius of curvature and a thickness of a lens and a measurement method thereof. The non-contact measurement device utilizes a non-contact probe to integrate a motor, an optical scale and an electronic control module, so as to achieve measurement for the radius of curvature and the thickness of the lens. The present disclosure adopts astigmatism to achieve fast and precise focusing. To overcome the spherical aberration problem, thickness measurement can be implemented by the non-contact measurement device through a formula calculation and utilization of a correction plate, wherein single one probe is used for the measurement herein. For the thicker lens, the non-contact measurement device can be extended to use dual probes, so as to detect the top and bottom sides of the lens.
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