Invention Grant
- Patent Title: Probe, ultrasonic testing apparatus, and ultrasonic testing control method
-
Application No.: US15025555Application Date: 2014-09-03
-
Publication No.: US10261055B2Publication Date: 2019-04-16
- Inventor: Hiroshi Takemoto , Mitsuyoshi Uematsu , Seiichi Kawanami
- Applicant: MITSUBISHI HEAVY INDUSTRIES, LTD.
- Applicant Address: JP Tokyo
- Assignee: MITSUBISHI HEAVY INDUSTRIES, LTD.
- Current Assignee: MITSUBISHI HEAVY INDUSTRIES, LTD.
- Current Assignee Address: JP Tokyo
- Agency: Hauptman Ham, LLP
- Priority: JP2013-210516 20131007
- International Application: PCT/JP2014/073254 WO 20140903
- International Announcement: WO2015/053014 WO 20150416
- Main IPC: G01N29/26
- IPC: G01N29/26 ; B06B1/06 ; G10K11/34 ; G01N29/24

Abstract:
A probe provided with a transceiving surface longer in a length direction than in a width direction thereof, and an array of ultrasonic elements provided on the transceiving surface, the probe being for emitting ultrasonic waves to a surface to be inspected of an object to be inspected that faces the transceiving surface, while moving in the width direction, the ultrasonic elements being shaped so as to have the same length in the length direction and in the width direction, and the certain of ultrasonic elements being aligned in the length direction and in the width direction and emitting ultrasonic waves a large number of times throughout the length direction in predetermined emission units of one or more ultrasonic elements.
Public/Granted literature
- US20160238567A1 PROBE, ULTRASONIC TESTING APPARATUS, AND ULTRASONIC TESTING CONTROL METHOD Public/Granted day:2016-08-18
Information query