Invention Grant
- Patent Title: Structured illuminating microscopy apparatus
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Application No.: US14597495Application Date: 2015-01-15
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Publication No.: US10261304B2Publication Date: 2019-04-16
- Inventor: Hiroshi Ohki , Tomoya Noda , Yosuke Okudaira
- Applicant: NIKON CORPORATION
- Applicant Address: JP Tokyo
- Assignee: NIKON CORPORATION
- Current Assignee: NIKON CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Oliff PLC
- Priority: JP2012-160805 20120719
- Main IPC: H04N7/18
- IPC: H04N7/18 ; G02B21/36 ; G02B21/06 ; G02B27/58

Abstract:
An acquiring unit of a structured illuminating microscopy apparatus acquires at least two modulated images having the same wave number vector and the different phases; and a calculating unit of the structured illuminating microscopy apparatus, in a spatial frequency spectrum of each of at least the two modulated images acquired by the acquiring unit, separates a 0th-order modulating component and ±first-order modulating components of observational light fluxes superimposed on arbitrary two observation points based on at least four observation values regarding the two observation points which are mutually displaced by an amount of the wave number vector.
Public/Granted literature
- US20150185463A1 STRUCTURED ILLUMINATING MICROSCOPY APPARATUS Public/Granted day:2015-07-02
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