Invention Grant
- Patent Title: Semiconductor structure and manufacturing method thereof
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Application No.: US14529772Application Date: 2014-10-31
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Publication No.: US10269904B2Publication Date: 2019-04-23
- Inventor: Chen-Hua Yu , Mirng-Ji Lii , Hung-Yi Kuo , Hao-Yi Tsai , Tsung-Yuan Yu , Min-Chien Hsiao , Chao-Wen Shih
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Current Assignee Address: TW Hsinchu
- Agency: WPAT, P.C., Intellectual Property Attorneys
- Agent Anthony King
- Main IPC: H01L23/522
- IPC: H01L23/522 ; H01L29/40 ; H01L21/765 ; H01L23/00 ; H01L23/525

Abstract:
The present disclosure provides a semiconductor structure. The semiconductor structure includes a circuit region, a seal ring region and an assembly isolation region. The circuit region includes a first conductive layer. The seal ring region includes a second conductive layer. The assembly isolation region is between the circuit region and the seal ring region. The first conductive layer and the second conductive layer respectively include a portion extending into the assembly isolation region thereby forming an electric component in the assembly isolation region.
Public/Granted literature
- US20160126324A1 SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF Public/Granted day:2016-05-05
Information query
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