Invention Grant
- Patent Title: Semiconductor device having two spacers
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Application No.: US15459155Application Date: 2017-03-15
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Publication No.: US10269906B2Publication Date: 2019-04-23
- Inventor: Po-Hsueh Li
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee Address: TW Hsinchu
- Agency: McClure, Qualey & Rodack, LLP
- Main IPC: H01L27/088
- IPC: H01L27/088 ; H01L29/417 ; H01L29/66 ; H01L21/8234 ; H01L21/285 ; H01L29/78 ; H01L27/12 ; H01L29/08 ; H01L29/165

Abstract:
A semiconductor device includes a substrate, a source/drain feature, a gate structure, a contact, a gate spacer, and a contact spacer. The source/drain feature is at least partially disposed in the substrate. The gate structure is disposed on the substrate and adjacent to the source/drain feature. The contact is electrically connected to the source/drain feature. The gate spacer is disposed on a sidewall of the gate structure and between the gate structure and the contact. The contact spacer is disposed on the gate spacer and on a sidewall of the contact. An interface is formed between the gate spacer and the contact spacer, and a bottom surface of the contact spacer is in contact with the contact.
Public/Granted literature
- US20180151678A1 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF Public/Granted day:2018-05-31
Information query
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