Invention Grant
- Patent Title: System and method for testing true stress and true strain
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Application No.: US15147055Application Date: 2016-05-05
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Publication No.: US10281378B2Publication Date: 2019-05-07
- Inventor: Edward Wenski
- Applicant: HONEYWELL FEDERAL MANUFACTURING & TECHNOLOGIES LLC
- Applicant Address: US MO Kansas City
- Assignee: Honeywell Federal Manufacturing & Technologies, LLC
- Current Assignee: Honeywell Federal Manufacturing & Technologies, LLC
- Current Assignee Address: US MO Kansas City
- Agency: Hovey Williams LLP
- Main IPC: G01N3/06
- IPC: G01N3/06 ; G01L1/24 ; H04N5/225 ; H04N5/247 ; G01M11/08 ; G01N3/08 ; G06T7/62

Abstract:
A true stress testing system broadly comprising a force input machine, an imaging system, and a computer. The imaging system includes a light source for projecting a light beam at the specimen in a first direction and a camera positioned on an opposite side of the specimen for receiving portions of the light beam not blocked by the specimen such that a shadow image of the specimen is created via the camera. The computer may determine a minimum dimension of the specimen perpendicular to the first direction at a point in time over a plurality of points along the force axis via the shadow image of the specimen such that the processor accounts for changes in position of the minimum dimension along the specimen. A true stress of the specimen may then be determined according to the minimum dimension of the specimen perpendicular to the first direction at the point in time.
Public/Granted literature
- US20170322129A1 SYSTEM AND METHOD FOR TESTING TRUE STRESS AND TRUE STRAIN Public/Granted day:2017-11-09
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