Invention Grant
- Patent Title: Computing device, computing program, X-ray measuring system and X-ray measuring method
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Application No.: US16102097Application Date: 2018-08-13
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Publication No.: US10281411B2Publication Date: 2019-05-07
- Inventor: Taihei Mukaide
- Applicant: CANON KABUSHIKI KAISHA
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Canon USA Inc., IP Division
- Priority: JP2012-248625 20121112
- Main IPC: G01N23/083
- IPC: G01N23/083 ; G01N23/046 ; G01N23/207

Abstract:
A computing device configured to obtain information about a subject using a detection result detected by an X-ray detector which detects an X-ray passing through the subject, which device includes: a unit configured to obtain a detection result of the X-ray detector; a first obtaining unit configured to obtain a complex refractive index of the X-ray after passing through the subject using the detection result; and a second obtaining unit configured to obtain information about the subject in accordance with a correlation between the complex refractive index and a mass absorption coefficient.
Public/Granted literature
- US20190003991A1 COMPUTING DEVICE, COMPUTING PROGRAM, X-RAY MEASURING SYSTEM AND X-RAY MEASURING METHOD Public/Granted day:2019-01-03
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