Invention Grant
- Patent Title: Method and device for microscopic examination of a sample
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Application No.: US15327391Application Date: 2015-07-22
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Publication No.: US10281705B2Publication Date: 2019-05-07
- Inventor: Werner Knebel
- Applicant: LEICA MICROSYSTEMS CMS GMBH
- Applicant Address: DE Wetzlar
- Assignee: LEICA MICROSYSTEMS CMS GMBH
- Current Assignee: LEICA MICROSYSTEMS CMS GMBH
- Current Assignee Address: DE Wetzlar
- Agency: Leydig, Voit & Mayer, Ltd.
- Priority: LU92505 20140722
- International Application: PCT/EP2015/066799 WO 20150722
- International Announcement: WO2016/012518 WO 20160128
- Main IPC: G02B21/16
- IPC: G02B21/16 ; G01N21/64 ; G02B21/06 ; G02B27/56 ; G02B21/00

Abstract:
A method for microscopic examination of a specimen includes bringing the specimen into contact with an optically transparent medium that has a higher refractive index than the specimen. An illumination light bundle is generated and directed through an illumination objective that focuses the illumination light bundle. The illumination light bundle that has passed through the illumination objective in the direction of the specimen that is to be examined is deflected using a deflector arranged on a detection objective in such a way that the illumination light bundle strikes a boundary surface between the optically transparent medium and the specimen, where the illumination light bundle is totally reflected for purposes of evanescently illuminating the specimen. Fluorescent light that is emitted by the specimen and that passes through the detection objective is detected.
Public/Granted literature
- US20170160531A1 METHOD AND DEVICE FOR MICROSCOPIC EXAMINATION OF A SAMPLE Public/Granted day:2017-06-08
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