Invention Grant
- Patent Title: Measuring the vibration amplitude of a scanner mirror
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Application No.: US15529230Application Date: 2015-10-29
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Publication No.: US10281717B2Publication Date: 2019-05-07
- Inventor: Thomas Mitterlehner , Christian Kalousek
- Applicant: ZKW Group GmbH
- Applicant Address: AT Wieselburg
- Assignee: ZKW Group GmbH
- Current Assignee: ZKW Group GmbH
- Current Assignee Address: AT Wieselburg
- Agency: Eversheds Sutherland (US) LLP
- Priority: AT50849/2014 20141124
- International Application: PCT/AT2015/050272 WO 20151029
- International Announcement: WO2016/081966 WO 20160602
- Main IPC: F21S41/16
- IPC: F21S41/16 ; H04N1/113 ; G01H13/00 ; F21S41/14 ; G02B26/08 ; G02B26/10 ; F21S41/675 ; G01H9/00 ; F21S41/255

Abstract:
For measuring the oscillation amplitude of a scanner mirror in a projection system of a motor vehicle headlight, a laser beam generated by a laser source is directed onto the scanner mirror and reflected by the latter so that the laser beam thus reflected is incident on a detector device (20) that has a plurality of photodetector elements (Q1, Q2, Q3, Q4) and there describes a curve (P) based on the oscillation movement of the scanner mirror. The center point of the curve (P) is offset by an offset value (xoffset, yoffset) from the center of the detector device (20). The time period (tON,X, tON,Y) in which the curve passes through the specific detector region (RX, RY) that corresponds to a coordinate to be measured is determined; and the oscillation amplitude (xpp, ypp) in the direction of the specific coordinate is determined using the ratio of the time period (tON,X, tON,Y) determined in this manner to the total duration (T) of an oscillation period and the offsets (xoffset, yoffset).
Public/Granted literature
- US20170329130A1 MEASURING THE VIBRATION AMPLITUDE OF A SCANNER MIRROR Public/Granted day:2017-11-16
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