Invention Grant
- Patent Title: Image analysis for assessing image data
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Application No.: US15401884Application Date: 2017-01-09
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Publication No.: US10282838B2Publication Date: 2019-05-07
- Inventor: Camila Patricia Bazilio Nunes , Marina Lundgren de Almeida Magalhaes , Marcelo Blois Ribeiro , Dario Augusto Borges Oliveira , Eudemberg Fonseca Silva , Felipe Santos De Andrade , Marco Blumenthal , Giovanni John Jacques Palma , Serge Louis Wilfrid Mueller
- Applicant: General Electric Company
- Applicant Address: US NY Schenectady
- Assignee: GENERAL ELECTRIC COMPANY
- Current Assignee: GENERAL ELECTRIC COMPANY
- Current Assignee Address: US NY Schenectady
- Main IPC: G06T3/00
- IPC: G06T3/00 ; G06T7/00 ; G06F19/00 ; A61B6/00 ; G01T7/00

Abstract:
The present approach relates to providing image quality feedback to personnel (e.g., a technician) acquiring non-invasive images in real-time or near real-time. By way of example, the proposed approach may automatically assess the quality of images in real-time by evaluating the images for the presence or absence of non-conformities using processor-implemented, rule-based algorithms running partly or completely in parallel to one another. The proposed approach improves the image analysis pipeline by efficiently providing notification of and/or discarding low-quality or unsuitable images or exams after they are taken, such as in within seconds or minutes.
Public/Granted literature
- US20180197288A1 IMAGE ANALYSIS FOR ASSESSING IMAGE DATA Public/Granted day:2018-07-12
Information query
IPC分类:
G | 物理 |
G06 | 计算;推算或计数 |
G06T | 一般的图像数据处理或产生 |
G06T3/00 | 在图像平面内的图形图像转换 |