Invention Grant
- Patent Title: Semiconductor devices with post-probe configurability
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Application No.: US15811579Application Date: 2017-11-13
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Publication No.: US10283462B1Publication Date: 2019-05-07
- Inventor: James E. Davis , Kevin G. Duesman , Jeffrey P. Wright , Warren L. Boyer
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Perkins Coie LLP
- Main IPC: H01L23/60
- IPC: H01L23/60 ; H01L23/00 ; H01L25/04 ; H01L23/538

Abstract:
A semiconductor device assembly includes a substrate and a die coupled to the substrate. The die includes a first contact pad electrically coupled to a first circuit on the die including at least one active circuit element, a second contact pad electrically coupled to a second circuit on the die including only passive circuit elements, and a plated pad electrically coupling at least a part of the first contact pad to at least a part of the second contact pad. The substrate includes a substrate contact electrically coupled to the plated pad on the die.
Information query
IPC分类: