Invention Grant
- Patent Title: Charged particle radiation measuring method and charged particle radiation measuring device
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Application No.: US15756160Application Date: 2016-08-25
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Publication No.: US10294419B2Publication Date: 2019-05-21
- Inventor: Wataru Kada , Kenta Miura , Osamu Hanaizumi , Tomihiro Kamiya , Takahiro Satoh , Junichi Susaki , Suzuya Yamada
- Applicant: National University Corporation Gunma University , National Institutes For Quantum And Radiological Science And Technology , Denka Company Limited
- Applicant Address: JP Chuo-Ku, Tokyo JP Maebashi-Shi, Gunma JP Chiba-Shi, Chiba
- Assignee: Denka Company Limited,National University Corporation Gunma University,National Institutes For Quantum And Radiological Science And Technology
- Current Assignee: Denka Company Limited,National University Corporation Gunma University,National Institutes For Quantum And Radiological Science And Technology
- Current Assignee Address: JP Chuo-Ku, Tokyo JP Maebashi-Shi, Gunma JP Chiba-Shi, Chiba
- Agency: Servilla Whitney LLC
- Priority: JP2015-169363 20150828
- International Application: PCT/JP2016/074813 WO 20160825
- International Announcement: WO2017/038622 WO 20170309
- Main IPC: C09K11/64
- IPC: C09K11/64 ; G01T1/20 ; G01T1/202 ; C09K11/70 ; C09K11/77
Abstract:
[Problem] To provide highly heat-resistant and radiation-resistant radiation measuring equipment.[Solution] Provided are a charged particle radiation measuring method and a charged particle radiation measuring device using a scintillator comprising a phosphor in which the main component is a SiAlON phosphor.
Public/Granted literature
- US20180244990A1 Charged Particle Radiation Measuring Method And Charged Particle Radiation Measuring Device Public/Granted day:2018-08-30
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