Invention Grant
- Patent Title: Analyzing device, sensor testing device, testing method and computer-readable storage medium
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Application No.: US15046477Application Date: 2016-02-18
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Publication No.: US10295495B2Publication Date: 2019-05-21
- Inventor: Shinjiro Sekimoto
- Applicant: ARKRAY, Inc.
- Applicant Address: JP Kyoto
- Assignee: ARKRAY, Inc.
- Current Assignee: ARKRAY, Inc.
- Current Assignee Address: JP Kyoto
- Agency: Morgan, Lewis & Bockius LLP
- Priority: JP2011-021942 20110203; JP2011-021943 20110203; JP2011-286060 20111227
- Main IPC: G01N27/327
- IPC: G01N27/327 ; A61B5/145 ; A61B5/1486

Abstract:
There is provided a sensor testing method including: applying at least one of a first voltage that obtains a response caused by a substance and a second voltage that either obtains no response or substantially no response caused by the substance across a first electrode and a second electrode of a sensor; measuring current flowing between the first electrode and the second electrode; and determining whether or not there is a defect present in the sensor based on a quantity related to an amount of change per specific period of time of a current measured when the first voltage and/or the second voltage have been applied.
Public/Granted literature
- US20160161439A1 Analyzing Device, Sensor Testing Device, Testing Method and Computer-Readable Storage Medium Public/Granted day:2016-06-09
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