Invention Grant
- Patent Title: System for display of non-destructive testing region
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Application No.: US15519335Application Date: 2015-10-15
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Publication No.: US10295503B2Publication Date: 2019-05-21
- Inventor: Laurent Enenkel , Frederic Morrow , Alexandre Charlebois , Martin Garneau , Stephane Turgeon
- Applicant: Zetec, INC.
- Applicant Address: US WA Snoqualmie
- Assignee: ZETEC, INC.
- Current Assignee: ZETEC, INC.
- Current Assignee Address: US WA Snoqualmie
- Agency: Snyder, Clark, Lesch & Chung, LLP
- International Application: PCT/US2015/055683 WO 20151015
- International Announcement: WO2016/061319 WO 20160421
- Main IPC: G01N27/90
- IPC: G01N27/90 ; G01N29/06 ; G01N29/22 ; G01N29/265
Abstract:
A system for displaying an area covered in a non-destructive scan of an area larger than the test probe is disclosed. Position encoders are included on the test probe to track the motion of the probe and to provide a record of the portion of the area under test that has been covered by the probe.
Public/Granted literature
- US20170241956A1 SYSTEM FOR DISPLAY OF NON-DESTRUCTIVE TESTING REGION Public/Granted day:2017-08-24
Information query
