- Patent Title: Circuit for measuring flicker noise and method of using the same
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Application No.: US14688336Application Date: 2015-04-16
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Publication No.: US10295583B2Publication Date: 2019-05-21
- Inventor: Chao Chieh Li , Ruey-Bin Sheen
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Current Assignee Address: TW Hsinchu
- Agency: Hauptman Ham, LLP
- Main IPC: H03M1/08
- IPC: H03M1/08 ; H03M1/10 ; G01R29/26

Abstract:
A flicker noise measurement circuit includes a first section. The first section includes a plurality of first stages connected in series. The first section includes a first feedback switching element configured to selectively feedback an output of the plurality of first stages to an input of the plurality of first stages. The first section includes a first section connection switching element. The flicker noise measurement circuit includes a second section connected to the first section. The second section includes a plurality of second stages connected in series, wherein the first section connection switching element is configured to selectively connect the plurality of second stages to the plurality of first stages. The second section includes a second feedback switching element configured to selectively feedback an output of the plurality of second stages to the input of the plurality of first stages.
Public/Granted literature
- US20160305999A1 CIRCUIT FOR MEASURING FLICKER NOISE AND METHOD OF USING THE SAME Public/Granted day:2016-10-20
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