Invention Grant
- Patent Title: Distribution analyzing device and distribution analyzing method
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Application No.: US14770113Application Date: 2014-02-13
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Publication No.: US10295617B2Publication Date: 2019-05-21
- Inventor: Kenjiro Kimura
- Applicant: Kenjiro Kimura
- Applicant Address: JP Hyogo
- Assignee: Kenjiro Kimura
- Current Assignee: Kenjiro Kimura
- Current Assignee Address: JP Hyogo
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: JP2013-035177 20130225
- International Application: PCT/JP2014/000743 WO 20140213
- International Announcement: WO2014/129151 WO 20140828
- Main IPC: G01R33/10
- IPC: G01R33/10

Abstract:
A distribution analyzing device (20) includes: an obtaining unit (21) which obtains measurement data of a field measured, through a sensor sensing area, independently at each of rotation angles and at each of grid coordinate positions of the sensor sensing area; and a calculation unit (22) which calculates a distribution of the field from the measurement data, using an arithmetic expression obtained by deriving a target harmonic function, which indicates the distribution of the field, using a condition that a convolution of the target harmonic function and a shape function, which indicates a shape of a cross section of the finite sensor sensing area along a plane parallel to the measurement plane, is equal to a provisional harmonic function derived by solving the Laplace equation using the measurement data and a size of the sensor sensing area in a direction perpendicular to the measurement plane.
Public/Granted literature
- US20160018484A1 DISTRIBUTION ANALYZING DEVICE AND DISTRIBUTION ANALYZING METHOD Public/Granted day:2016-01-21
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