- Patent Title: Method and system for reducing grid line artifacts in X-ray image
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Application No.: US15459701Application Date: 2017-03-15
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Publication No.: US10297010B2Publication Date: 2019-05-21
- Inventor: Zhaoxia Zhang , Kun Tao , Hao Lai , Ming Yan , Han Kang
- Applicant: General Electric Company
- Applicant Address: US NY Schenectady
- Assignee: GENERAL ELECTRIC COMPANY
- Current Assignee: GENERAL ELECTRIC COMPANY
- Current Assignee Address: US NY Schenectady
- Agency: GE Global Patent Operation
- Agent Marc A. Vivenzio
- Priority: CN201610153082 20160317
- Main IPC: G06T5/00
- IPC: G06T5/00 ; G06T5/20 ; G06T5/50 ; G06K9/62 ; G06T5/10 ; G06T11/60 ; G06T7/13

Abstract:
A method for reducing grid line artifacts in an X-ray image is disclosed, which includes acquiring an X-ray image by scanning an object, wherein the X-ray image comprises grid line artifacts; decomposing the X-ray image into a high frequency image and a low frequency image, wherein the high frequency image comprises the grid line artifacts; filtering the high frequency image to reduce the grid line artifacts in the high frequency image so as to obtain a filtered high frequency image; and combining the filtered high frequency image with the low frequency image to reconstruct an output image. A system adopting the above method is also disclosed.
Public/Granted literature
- US20170270640A1 METHOD AND SYSTEM FOR REDUCING GRID LINE ARTIFACTS IN X-RAY IMAGE Public/Granted day:2017-09-21
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