Invention Grant
- Patent Title: Segmentation and spectrum based metal artifact reduction method and system
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Application No.: US15337075Application Date: 2016-10-28
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Publication No.: US10297048B2Publication Date: 2019-05-21
- Inventor: Zhifeng Huang , Thomas A. Case
- Applicant: Carl Zeiss X-ray Microscopy, Inc.
- Applicant Address: US CA Pleasanton
- Assignee: Carl Zeiss X-Ray Microscopy, Inc.
- Current Assignee: Carl Zeiss X-Ray Microscopy, Inc.
- Current Assignee Address: US CA Pleasanton
- Agency: HoustonHogle LLP
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06T11/00 ; G06T5/00 ; H04N5/32

Abstract:
A segmentation-and-spectrum-based metal artifact reduction (MAR) system and method is applied in polychromatic X-ray CT system that uses a priori knowledge of high-Z metals in samples which contribute the primary artifacts at a known x-ray energy spectrum. Using a basis materials decomposition, the method solves the problem of reducing or eliminating metal artifacts associated with beam hardening using only a single scan of the sample performed at selected x-ray energy.
Public/Granted literature
- US20170109904A1 Segmentation and Spectrum Based Metal Artifact Reduction Method and System Public/Granted day:2017-04-20
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