Invention Grant
- Patent Title: Standard inductance box
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Application No.: US15103308Application Date: 2014-12-01
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Publication No.: US10297378B2Publication Date: 2019-05-21
- Inventor: Pan Jin , Dian Jin
- Applicant: CHENGDU KAIPU ELECTRONIC SCIENCE AND TECHNOLOGIES CO. LTD.
- Applicant Address: CN Chengdu
- Assignee: CHENGDU KAIPU ELECTRONIC SCIENCE AND TECHNOLOGIES CO. LTD.
- Current Assignee: CHENGDU KAIPU ELECTRONIC SCIENCE AND TECHNOLOGIES CO. LTD.
- Current Assignee Address: CN Chengdu
- Agency: Mei & Mark LLP
- Priority: CN201310664625 20131210
- International Application: PCT/CN2014/092629 WO 20141201
- International Announcement: WO2015/085876 WO 20150618
- Main IPC: H01F21/12
- IPC: H01F21/12 ; H01F21/02 ; H01F27/29 ; H01F27/02 ; G01R1/28 ; G01R35/00 ; H01F27/24 ; H01F27/28

Abstract:
A standard inductance box, relating to the fields of measurement or calibration, and relating in particular to a standard gauge for transferring an inductance parameter. The standard inductance box uses unary, binary and quinary, and comprises a physical inductance box section and a simulated inductance box section, said sections being respectively arranged in a metal box. Electrodes of the physical inductance box section and the simulated inductance box section are led out. The inductance range of the standard inductance box is 1 μH-500 H. The described means achieve an inductance range of 1 μH-500 H, expanding the inductance range in the prior art, and the application of a simulated inductance box. Using unary, binary and quinary standards reduces the size and weight of the physical inductance box section, facilitating transportation and use in the field.
Public/Granted literature
- US20160293313A1 STANDARD INDUCTANCE BOX Public/Granted day:2016-10-06
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