Invention Grant
- Patent Title: Apparatus and method of gas analysis using laser light
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Application No.: US14913296Application Date: 2014-08-21
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Publication No.: US10302563B2Publication Date: 2019-05-28
- Inventor: Yoshihiro Deguchi , Takahiro Kamimoto
- Applicant: Tokushima University
- Applicant Address: JP Tokushima
- Assignee: Tokushima University
- Current Assignee: Tokushima University
- Current Assignee Address: JP Tokushima
- Agency: Dorsey & Whitney LLP
- Priority: JP2013-171366 20130821
- International Application: PCT/JP2014/071877 WO 20140821
- International Announcement: WO2015/025919 WO 20150226
- Main IPC: G01N21/61
- IPC: G01N21/61 ; G01N21/3504 ; G01J3/427 ; G01N21/31 ; G01N21/39 ; G01J5/00 ; G01J3/433 ; G01J5/60 ; G01K11/18 ; G01K11/00

Abstract:
A gas analyzing apparatus includes first and second laser sources that output first and second laser lights, a laser controller that controls the first and second laser sources to vary wavelengths of the first and second laser lights in the respective predetermined wavelength ranges, an optical multiplexer that multiplexes the first and second laser lights to transmit the multiplexed laser light to a target gas, an optical receiver that receives the laser light transmitted through the target gas, and an analyzer that analyzes a temperature and/or a concentration of the target gas based on an electric signal output from the optical receiver. While varying the wavelengths of the laser lights, the laser controller controls amplitudes of the first and second laser lights to differ from each other and varies intensities of the first and second laser lights in the opposite direction.
Public/Granted literature
- US20160178517A1 APPARATUS AND METHOD OF GAS ANALYSIS USING LASER LIGHT Public/Granted day:2016-06-23
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