Invention Grant
- Patent Title: Method and device for recognizing and removing undesired artifacts in multichannel magnetic field or electric potential measurements
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Application No.: US14374365Application Date: 2013-01-24
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Publication No.: US10307105B2Publication Date: 2019-06-04
- Inventor: Samu Taulu , Matti Kajola , Juha Simola
- Applicant: Elekta AB
- Applicant Address: SE Stockholm
- Assignee: Elekta AB
- Current Assignee: Elekta AB
- Current Assignee Address: SE Stockholm
- Agency: Michael Best & Friedrich LLP
- Priority: FI20125075 20120124
- International Application: PCT/IB2013/050595 WO 20130124
- International Announcement: WO2013/111072 WO 20130801
- Main IPC: H04B1/10
- IPC: H04B1/10 ; A61B5/00 ; A61B5/04 ; G01R33/035 ; G01R29/12 ; G01R33/02 ; G01R33/56 ; G06K9/00 ; A61B5/0476 ; A61B5/055

Abstract:
The present invention introduces a method, device and a computer program for removing artifacts present in individual channels of a multichannel measurement device. At first, a basis is generated defining an n-dimensional subspace of the N-dimensional signal space, where n is smaller than N, where using in the definition of the n-dimensional basis a physical model of a Signal Space Separation method, or a statistical model based on the statistics of recorded N-dimensional signals. Thereafter, a combined (n+m)-dimensional basis is formed by adding m signal vectors to the n-dimensional basis, each of these m signal vectors representing a signal present only in a single channel of the N-channel device. After this the recorded N-dimensional signal vector is decomposed into n+m components in the combined basis, and finally, components corresponding to the m added vectors in the combined basis are subtracted from the recorded N-dimensional signal vector.
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