Invention Grant
- Patent Title: X-ray imaging device
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Application No.: US15152829Application Date: 2016-05-12
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Publication No.: US10307128B2Publication Date: 2019-06-04
- Inventor: Kazuyoshi Nishino
- Applicant: SHIMADZU CORPORATION
- Applicant Address: JP Kyoto
- Assignee: SHIMADZU CORPORATION
- Current Assignee: SHIMADZU CORPORATION
- Current Assignee Address: JP Kyoto
- Agency: Lackenbach Siegel, LLP
- Agent Andrew F. Young, Esq.
- Main IPC: A61B6/00
- IPC: A61B6/00 ; A61B6/04

Abstract:
An X-ray imaging device and method acquiring a long-length image that is connected. A configuration data of the signal intensity depending on the position along a moving direction of the long-length imaging is acquired by acquiring a model data prior to the long-length imaging, to obtain an approximate configuration A long-length imaging is conducted and a brightness difference takes place along the data line in overlapping pixel regions relative to two X-ray images adjacent each other. An offset correction value C in pixels in the region other than the pixel regions from the difference Δ of pixel values in such overlapping pixel regions, the slot width D and the overlapping width d. An offset correction is conducted based on such offset correction value, C and the X-ray images following the offset correction are connected to generate the long-length imaging to obtain a long-length image that is naturally connected.
Public/Granted literature
- US20170325773A1 X-RAY IMAGING DEVICE Public/Granted day:2017-11-16
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