Invention Grant
- Patent Title: Method of producing semiconductor chip, and mask-integrated surface protective tape used therein
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Application No.: US15868866Application Date: 2018-01-11
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Publication No.: US10307866B2Publication Date: 2019-06-04
- Inventor: Hirotoki Yokoi , Tomoaki Uchiyama , Yoshifumi Oka
- Applicant: FURUKAWA ELECTRIC CO., LTD.
- Applicant Address: JP Tokyo
- Assignee: FURUKAWA ELECTRIC CO., LTD.
- Current Assignee: FURUKAWA ELECTRIC CO., LTD.
- Current Assignee Address: JP Tokyo
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: JP2015-219736 20151109; JP2015-219738 20151109
- Main IPC: B23K26/351
- IPC: B23K26/351 ; B23K26/352 ; C09J201/00 ; C09J7/20 ; H01L21/304 ; B23K26/362 ; H01L21/78 ; H01L21/683 ; H01L21/308

Abstract:
A method of producing a semiconductor chip, including the following steps (a) to (d): (a) a step of, in the state of having laminated a mask-integrated surface protective tape on the side of a patterned surface of a semiconductor wafer, grinding the backing-face of the semiconductor wafer; laminating a wafer fixing tape on the backing-face side of the ground semiconductor wafer; and supporting and fixing the wafer to a ring flame; (b) a step of, after peeling the surface protective tape thereby to expose the mask material layer on top, forming an opening of a street of the semiconductor wafer; (c) a plasma dicing step of segmentalizing the semiconductor wafer by a plasma irradiation to singulate it into semiconductor chips; and (d) an ashing step of removing the mask material layer by the plasma irradiation.
Public/Granted literature
- US20180185964A1 METHOD OF PRODUCING SEMICONDUCTOR CHIP, AND MASK-INTEGRATED SURFACE PROTECTIVE TAPE USED THEREIN Public/Granted day:2018-07-05
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