- Patent Title: Method of preparing sample for crystal structure analysis, method of determining absolute configuration of chiral compound, and polynuclear metal complex monocrystal
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Application No.: US15124897Application Date: 2015-03-09
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Publication No.: US10309035B2Publication Date: 2019-06-04
- Inventor: Makoto Fujita , Yasuhide Inokuma , Tatsuhiko Arai
- Applicant: The University of Tokyo
- Applicant Address: JP Tokyo
- Assignee: THE UNIVERSITY OF TOKYO
- Current Assignee: THE UNIVERSITY OF TOKYO
- Current Assignee Address: JP Tokyo
- Agency: Westerman, Hattori, Daniels & Adrian, LLP
- Priority: JP2014-046706 20140310
- International Application: PCT/JP2015/056871 WO 20150309
- International Announcement: WO2015/137288 WO 20150917
- Main IPC: G01N1/28
- IPC: G01N1/28 ; G01N23/207 ; C30B7/14 ; C30B29/54 ; C30B7/06

Abstract:
Method for preparing a crystal structure analysis sample for determining an absolute configuration of a chiral compound includes bringing a single crystal of a porous compound into contact with a solvent solution that contains a chiral compound, the single crystal of the porous compound including a three-dimensional framework, and either or both of pores and voids that are defined by the three-dimensional framework, and are three-dimensionally arranged in an ordered manner, the three-dimensional framework being formed by one molecular chain or two or more molecular chains, or formed by one molecular chain or two or more molecular chains, and a framework-forming compound, and comprising a chiral substituent of which the absolute configuration is known, the crystal structure analysis sample having a structure in which molecules of the chiral compound are arranged in either or both of the pores and the voids of the single crystal in an ordered manner.
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