Invention Grant
- Patent Title: Characterization of trace crystallinity by second harmonic generation microscopy
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Application No.: US15514893Application Date: 2015-09-28
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Publication No.: US10309902B2Publication Date: 2019-06-04
- Inventor: Garth Jason Simpson , Paul David Schmitt
- Applicant: Purdue Research Foundation
- Applicant Address: US IN West Lafayette
- Assignee: PURDUE RESEARCH FOUNDATION
- Current Assignee: PURDUE RESEARCH FOUNDATION
- Current Assignee Address: US IN West Lafayette
- Agency: Purdue Research Foundation
- International Application: PCT/US2015/052604 WO 20150928
- International Announcement: WO2016/049623 WO 20160331
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01N21/65 ; G01N23/207 ; G01N21/63
Abstract:
A method for quantifying crystallinity within a sample using second harmonic generation microscopy is described herein. In one aspect, a method for reducing the timeframe for accelerated stability testing of amorphous solid dispersions of active pharmaceutical ingredients though identifying regions of interest to quantify crystallinity and composition is presented herein.
Public/Granted literature
- US20170212053A1 CHARACTERIZATION OF TRACE CRYSTALLINITY BY SECOND HARMONIC GENERATION MICROSCOPY Public/Granted day:2017-07-27
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