Invention Grant
- Patent Title: Substrate for sample analysis, sample analysis device, sample analysis system, and program for sample analysis system
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Application No.: US15322910Application Date: 2015-06-29
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Publication No.: US10309976B2Publication Date: 2019-06-04
- Inventor: Masahiro Johno , Fusatoshi Okamoto
- Applicant: PHC HOLDINGS CORPORATION
- Applicant Address: JP Tokyo
- Assignee: PHC HOLDINGS CORPORATION
- Current Assignee: PHC HOLDINGS CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: McDermott Will & Emery LLP
- Priority: JP2014-134777 20140630
- International Application: PCT/JP2015/068722 WO 20150629
- International Announcement: WO2016/002727 WO 20160107
- Main IPC: G01N21/75
- IPC: G01N21/75 ; G01N35/00 ; G01N33/487 ; G01N33/53

Abstract:
A substrate for sample analysis has a rotation axis, a first chamber having a first space for retaining a liquid, a second chamber having a second space for retaining the liquid to be discharged from the first chamber, and a first channel having a path connecting the first chamber and the second chamber. The first space includes a first portion and a second portion, and a coupling portion located between the first and second portions. The substrate includes a wall portion partitioning the first and second portions from each other. The second chamber is more distant from the rotation axis than is the first portion. The coupling portion is closer to the rotation axis than is the wall portion. The second portion at least includes a portion which is more distant from the rotation axis than is the first portion.
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