Invention Grant
- Patent Title: Measurement apparatus
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Application No.: US15728257Application Date: 2017-10-09
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Publication No.: US10309989B2Publication Date: 2019-06-04
- Inventor: Peter Bogner , Franz Kuttner
- Applicant: Infineon Technologies AG
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Agency: Shumaker & Seiffert, P.A.
- Main IPC: G01R15/06
- IPC: G01R15/06

Abstract:
Measurement apparatuses and methods are described. A measurement input is coupled with a first terminal of a capacitance via a first switch, and a reference voltage is coupled with the first terminal of the capacitance via a second switch. A measurement circuit is coupled to a second terminal of said capacitance.
Public/Granted literature
- US20180031610A1 MEASUREMENT APPARATUS Public/Granted day:2018-02-01
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