Invention Grant
- Patent Title: Method and apparatus for calculating offset of wheatstone bridge type sensor
-
Application No.: US15702578Application Date: 2017-09-12
-
Publication No.: US10310050B2Publication Date: 2019-06-04
- Inventor: Won Ki Park , Dae Sung Lee
- Applicant: Korea Electronics Technology Institute
- Applicant Address: KR Seongnam-si
- Assignee: KOREA ELECTRONICS TECHNOLOGY INSTITUTE
- Current Assignee: KOREA ELECTRONICS TECHNOLOGY INSTITUTE
- Current Assignee Address: KR Seongnam-si
- Agency: Knobbe Martens Olson & Bear LLP
- Priority: KR10-2016-0177483 20161223
- Main IPC: G01R35/00
- IPC: G01R35/00 ; G01R17/10 ; G01R33/07

Abstract:
A method and an apparatus for calculating an offset of a Wheatstone bridge type sensor are described. The offset calculation method includes measuring resistances between nodes of a Wheatstone bridge type sensor, calculating an offset of the sensor using the measured resistances and providing information on the calculated offset. Accordingly, the offset of the Wheatstone bridge type sensor can be rapidly and easily calculated independently from the size of a bias current, and ultimately. Furthermore, time required to measure can be reduced and thus a sensor fabrication cost can be reduced, and also, mass production can be enhanced.
Public/Granted literature
- US20180180700A1 METHOD AND APPARATUS FOR CALCULATING OFFSET OF WHEATSTONE BRIDGE TYPE SENSOR Public/Granted day:2018-06-28
Information query