Invention Grant
- Patent Title: Method and apparatus for detecting repetitive structures in 3D mesh models
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Application No.: US13807322Application Date: 2010-06-30
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Publication No.: US10311635B2Publication Date: 2019-06-04
- Inventor: Kangying Cai , Weiwei Li , Zhibo Chen
- Applicant: Kangying Cai , Weiwei Li , Zhibo Chen
- Applicant Address: US DE Wilmington
- Assignee: InterDigital VC Holdings, Inc.
- Current Assignee: InterDigital VC Holdings, Inc.
- Current Assignee Address: US DE Wilmington
- Agent Brian J. Dorini; Paul P. Kiel
- International Application: PCT/CN2010/000984 WO 20100630
- International Announcement: WO2012/000132 WO 20120105
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06K9/46 ; G06K9/48 ; G06T17/10 ; G06T19/00

Abstract:
Discovering repetitive structures in 3D models is a challenging task. A method for detecting repetitive structures in 3D models comprises sampling the 3D model using a current sampling step size, detecting repetitive structures and remaining portions of the model, determining a representative for each of the one or more repetitive structures, and as long as the detecting step yields one or more repetitive structures, reducing the current sampling step size and repeating the steps of sampling and detecting for each detected representative of a detected repetitive structure and for the remaining portions of the model, wherein the reduced sampling step size is used. The described method and device can e.g. be used for 3D model compression, 3D model repairing, or geometry synthesis.
Public/Granted literature
- US20130103365A1 METHOD AND APPARATUS FOR DETECTING REPETITIVE STRUCTURES IN 3D MESH MODELS Public/Granted day:2013-04-25
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