Invention Grant
- Patent Title: Measuring and analyzing electrical resistance in tunneling magnetoresist sensors to identify damaged sensors
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Application No.: US14501090Application Date: 2014-09-30
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Publication No.: US10311902B2Publication Date: 2019-06-04
- Inventor: Milad Aria , Icko E. T. Iben , Guillermo F. Paniagua
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Andrew Aubert
- Main IPC: G11B5/39
- IPC: G11B5/39 ; G11B5/455

Abstract:
Embodiments of the present invention provide methods, systems, and computer program products for detecting damage to tunneling magnetoresistance (TMR) sensors. In one embodiment, resistances of a TMR sensor are measured upon application of one or both of negative polarity bias current and positive polarity bias current at a plurality of current magnitudes. Resistances of the TMR sensor can then be analyzed with respect to current, voltage, voltage squared, and/or power, including analyzes of changes to slopes calculated with these values and hysteresis-induced fluctuations, all of which can be used to detect damage to the TMR sensor. The present invention also describes methods to utilize the measured values of neighbor TMR sensors to distinguish normal versus damaged parts for head elements containing multiple TMR read elements.
Public/Granted literature
- US20160093320A1 DETECTING DAMAGE TO TUNNELING MAGNETORESISTANCE SENSORS Public/Granted day:2016-03-31
Information query
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