Invention Grant
- Patent Title: Temperature control system and temperature control method
-
Application No.: US14879438Application Date: 2015-10-09
-
Publication No.: US10312062B2Publication Date: 2019-06-04
- Inventor: Tsutomu Hiroki
- Applicant: TOKYO ELECTRON LIMITED
- Applicant Address: JP Tokyo
- Assignee: TOKYO ELECTRON LIMITED
- Current Assignee: TOKYO ELECTRON LIMITED
- Current Assignee Address: JP Tokyo
- Agency: Nath, Goldberg & Meyer
- Agent Jerald L. Meyer
- Priority: JP2014-209699 20141014
- Main IPC: H01L21/67
- IPC: H01L21/67 ; H01J37/32

Abstract:
There is provided a temperature control system, including: a stage configured to support a workpiece and provided with a heat exchange medium flow path formed within the stage, the heat exchange medium flow path including a first end and a second end; a first valve; a second valve; a first heat exchange medium supply device including a supply port which supplies a first heat exchange medium adjusted to have a first temperature and a recovery port; a second heat exchange medium supply device including a supply port which supplies a second heat exchange medium adjusted to have a second temperature higher than the first temperature and a recovery port; and a control device configured to control the first and second valves such that the first and second heat exchange mediums are alternately supplied to the first end of the heat exchange medium flow path.
Public/Granted literature
- US20160104605A1 TEMPERATURE CONTROL SYSTEM AND TEMPERATURE CONTROL METHOD Public/Granted day:2016-04-14
Information query
IPC分类: