Invention Grant
- Patent Title: Wafer processing method
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Application No.: US15964396Application Date: 2018-04-27
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Publication No.: US10312099B2Publication Date: 2019-06-04
- Inventor: Kazuma Sekiya , Karl Heinz Priewasser
- Applicant: DISCO CORPORATION
- Applicant Address: JP Tokyo
- Assignee: Disco Corporation
- Current Assignee: Disco Corporation
- Current Assignee Address: JP Tokyo
- Agency: Greer Burns & Crain, Ltd.
- Priority: JP2017-090060 20170428
- Main IPC: H01L21/56
- IPC: H01L21/56 ; H01L21/78 ; H01L21/304 ; H01L21/683

Abstract:
A wafer processing method includes a protective film providing step of providing a protective film on the front side of a wafer, a wafer unit forming step of applying a liquid resin curable by an external stimulus to the front side of the wafer and then curing the liquid resin by applying the external stimulus to form a protective member, thereby forming a wafer unit composed of the wafer, the protective film, and the protective member in the condition where the front side of the wafer is covered with the protective member, a grinding step of holding the protective member on a holding surface of a chuck table and then grinding the back side of the wafer of the wafer unit to thereby reduce the thickness of the wafer, and a peeling step of peeling the protective member and the protective film from the wafer reduced in thickness.
Public/Granted literature
- US20180315610A1 WAFER PROCESSING METHOD Public/Granted day:2018-11-01
Information query
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