Invention Grant
- Patent Title: Self-adhesive die
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Application No.: US14541208Application Date: 2014-11-14
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Publication No.: US10312212B2Publication Date: 2019-06-04
- Inventor: Rongwei Zhang
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee Address: US TX Dallas
- Agent Dawn Jos; Charles A. Brill; Frank D. Cimino
- Main IPC: B82Y10/00
- IPC: B82Y10/00 ; B82Y40/00 ; H01L23/00 ; H01L23/495 ; H01L29/06

Abstract:
An apparatus for enhancing the thermal performance of semiconductor packages effectively. The concept of this invention is to provide silicon nanowires on the backside of an integrated circuit die to directly attach the die to the substrate, thereby improving the interface between die and substrate, and thus enhancing thermal performance and enhancing reliability by improving adhesion.
Public/Granted literature
- US20150171046A1 SELF-ADHESIVE DIE Public/Granted day:2015-06-18
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