Invention Grant
- Patent Title: X-ray detector
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Application No.: US15757994Application Date: 2016-09-07
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Publication No.: US10312292B2Publication Date: 2019-06-04
- Inventor: Sung Kyn Heo , Dong Hui Shin , Tae Woo Kim , Min Seok Yun
- Applicant: Rayence Co., Ltd. , VATECH EWOO Holdings Co., Ltd.
- Applicant Address: KR Gyeonggi-do KR Gyeonggi-do
- Assignee: Rayence Co., Ltd.,VATECH EWOO Holdings Co., Ltd.
- Current Assignee: Rayence Co., Ltd.,VATECH EWOO Holdings Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do KR Gyeonggi-do
- Agency: IP Legal Services, LLC
- Priority: KR10-2015-0126401 20150907; KR10-2016-0055463 20160504; KR10-2016-0055518 20160504
- International Application: PCT/KR2016/010041 WO 20160907
- International Announcement: WO2017/043871 WO 20170316
- Main IPC: H01L27/30
- IPC: H01L27/30 ; G01T1/24 ; A61B6/14 ; A61B6/00 ; C09K11/66 ; C09K11/88 ; C09J133/14 ; G01T1/20 ; H01L51/42 ; H01L51/44 ; H01G9/20 ; H01L51/00 ; A61B6/03
Abstract:
Disclosed is a direct-conversion-type X-ray detector, including a first electrode on a substrate, a semiconductor structure including a photoconductor using a perovskite material on the first electrode, and a second electrode on the semiconductor structure.
Public/Granted literature
- US20180240848A1 X-RAY DETECTOR Public/Granted day:2018-08-23
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