Invention Grant
- Patent Title: Semiconductor device and method for fabricating the same
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Application No.: US16212700Application Date: 2018-12-07
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Publication No.: US10312353B2Publication Date: 2019-06-04
- Inventor: En-Chiuan Liou , Yu-Cheng Tung
- Applicant: UNITED MICROELECTRONICS CORP.
- Applicant Address: TW Hsin-Chu
- Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee Address: TW Hsin-Chu
- Agent Winston Hsu
- Priority: CN201710679485 20170810
- Main IPC: H01L29/24
- IPC: H01L29/24 ; H01L29/66 ; H01L29/08 ; H01L29/161 ; H01L29/06 ; H01L27/092 ; H01L21/02 ; H01L21/225 ; H01L21/8238

Abstract:
A method for fabricating a semiconductor structure is provided in the present invention. The method includes the steps of forming a plurality of fins in a first region, a second region and a dummy region, forming a first solid-state dopant source layer and a first insulating buffer layer in the first region, forming a second solid-state dopant source layer and a second insulating buffer layer in the second region and the dummy region, and performing an etch process to cut the fin in the dummy region.
Public/Granted literature
- US20190109207A1 SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME Public/Granted day:2019-04-11
Information query
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