Invention Grant
- Patent Title: Apparatus and method for single-photon avalanche-photodiode detectors with reduced dark count rate
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Application No.: US15285201Application Date: 2016-10-04
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Publication No.: US10312391B2Publication Date: 2019-06-04
- Inventor: Gang Chen , Duli Mao , Vincent Venezia , Dyson H. Tai , Bowei Zhang
- Applicant: OmniVision Technologies, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: OmniVision Technologies, Inc.
- Current Assignee: OmniVision Technologies, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Lathrop Gage LLP
- Main IPC: H01L31/0352
- IPC: H01L31/0352 ; H01L31/02 ; H01L31/107 ; H01L31/0224 ; H01L27/144

Abstract:
An avalanche photodiode has a first diffused region of a first diffusion type overlying at least in part a second diffused region of a second diffusion type; and a first minority carrier sink region disposed within the first diffused region, the first minority carrier sink region of the second diffusion type and electrically connected to the first diffused region. In particular embodiments, the first diffusion type is N-type and the second diffusion type is P-type, and the device is biased so that a depletion zone having avalanche multiplication exists between the first and second diffused regions.
Public/Granted literature
- US20180097132A1 Apparatus And Method For Single-Photon Avalanche-Photodiode Detectors With Reduced Dark Count Rate Public/Granted day:2018-04-05
Information query
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