Invention Grant
- Patent Title: On-chip waveform measurement
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Application No.: US15420191Application Date: 2017-01-31
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Publication No.: US10312892B2Publication Date: 2019-06-04
- Inventor: Andreas Arp , Fatih Cilek , Michael V. Koch , Matthias Ringe
- Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Applicant Address: US NY Armonk
- Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee Address: US NY Armonk
- Agency: Cantor Colburn LLP
- Agent Steven Meyers
- Main IPC: H03K5/00
- IPC: H03K5/00 ; H03K5/04 ; H03K5/26 ; G04F10/00 ; G01R25/00

Abstract:
A circuit for measuring a transition time of a digital signal may be provided. The circuit comprises a window detector comprising a comparator circuitry arranged for generating a first signal based on comparing said digital signal with a first reference voltage and for generating a second signal based on comparing said digital signal with a second reference voltage. Additionally, the circuit comprises a time-difference-to-digital converter operable for converting a delay between an edge of said first signal and an edge of said second signal into a digital value, said digital value characterizing said transition time of said digital signal.
Public/Granted literature
- US20180219538A1 ON-CHIP WAVEFORM MEASUREMENT Public/Granted day:2018-08-02
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