Invention Grant
- Patent Title: Measurement method and apparatus for residual direct-current components and a system
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Application No.: US15664105Application Date: 2017-07-31
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Publication No.: US10313008B2Publication Date: 2019-06-04
- Inventor: Hao Chen , Zhenning Tao
- Applicant: Fujitsu Limited
- Applicant Address: JP Kawasaki
- Assignee: FUJITSU LIMITED
- Current Assignee: FUJITSU LIMITED
- Current Assignee Address: JP Kawasaki
- Agency: Staas & Halsey LLP
- Priority: CN201610822223 20160913
- Main IPC: H04B17/13
- IPC: H04B17/13 ; H04B10/079 ; H04B10/61

Abstract:
A measurement method and apparatus for residual direct-current components and a system where the measurement method includes: selecting a section of data of a first predetermined length respectively from received signals in two polarization states; performing a coordinate transform on the two selected sections of data to obtain a group of vectors of Strokes space; and determining a difference between power of the residual direct-current components according to the group of vectors of Strokes space. With the embodiments of this disclosure, residual direct-current components of an optical transmitter may be measured at a receiver end of a coherent optical communication system, thereby avoiding diagnosis errors of a communication network, and improving performance of the communication system.
Public/Granted literature
- US20180076888A1 MEASUREMENT METHOD AND APPARATUS FOR RESIDUAL DIRECT-CURRENT COMPONENTS AND A SYSTEM Public/Granted day:2018-03-15
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