Invention Grant
- Patent Title: Test system and method for testing a device under test
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Application No.: US15787231Application Date: 2017-10-18
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Publication No.: US10313032B2Publication Date: 2019-06-04
- Inventor: Corbett Rowell , Hendrik Bartko , Adam Tankielun
- Applicant: Rohde & Schwarz GmbH & Co. KG
- Applicant Address: DE Munich
- Assignee: Rohde & Schwarz GmbH & Co. KG
- Current Assignee: Rohde & Schwarz GmbH & Co. KG
- Current Assignee Address: DE Munich
- Agency: Christensen O'Connor Johnson Kindness PLLC
- Priority: EP16194564 20161019
- Main IPC: H04B17/12
- IPC: H04B17/12 ; H01Q3/26 ; H04B5/00 ; G01R29/08 ; G01R29/10 ; H01Q1/08 ; H01Q19/06
Abstract:
A test system for testing a device under test is described, which comprises an antenna array having a plurality of antenna elements and an adjustment unit having a Fresnel structure. The adjustment unit is placed between the antenna array and the device under test. Further, a method for testing a device under test is described.
Public/Granted literature
- US20180109335A1 TEST SYSTEM AND METHOD FOR TESTING A DEVICE UNDER TEST Public/Granted day:2018-04-19
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