Invention Grant
- Patent Title: Time delay integration image capture method correcting image defects caused by cosmic particles
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Application No.: US15328968Application Date: 2015-07-23
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Publication No.: US10313566B2Publication Date: 2019-06-04
- Inventor: Pierre Fereyre , Philippe Moenne-Loccoz
- Applicant: E2V SEMICONDUCTORS
- Applicant Address: FR Saint-Égrève
- Assignee: TELEDYNE E2V SEMICONDUCTORS SAS
- Current Assignee: TELEDYNE E2V SEMICONDUCTORS SAS
- Current Assignee Address: FR Saint-Égrève
- Agency: Pilloff & Passino LLP
- Agent Sean A. Passino; Rachel K. Pilloff
- Priority: FR1457300 20140728
- International Application: PCT/EP2015/066929 WO 20150723
- International Announcement: WO2016/016103 WO 20160204
- Main IPC: H04N5/217
- IPC: H04N5/217 ; H04N5/357 ; H04N5/374

Abstract:
To eliminate image defects produced by high-energy particles passing through a time delay integration image sensor, upstream detection is effected on the digital values supplied by the pixels of the same rank that have successively observed the same scene point. This detection makes it possible to ignore or to correct values from corrupted pixels in establishing the digital signal representing the luminance of an observed scene point. Detection is based on the calculation of the difference between a first digital value pi,a(t1) and a second digital value pi,b(t2) supplied by two pixels Pxi,a and Pxi,b that have observed the same scene point, subtracting the second value from the first, and comparing it to a predetermined threshold k. If this difference is above the threshold, the first value is too high, the first value is ignored in the summation Σ′i effected to establish the luminance of the scene point, replacing this value with the second value to which it has been compared. Alternatively it is replaced by a mean value or excluded from the calculation.
Public/Granted literature
- US20170230547A1 TIME DELAY INTEGRATION IMAGE CAPTURE METHOD CORRECTING IMAGE DEFECTS CAUSED BY COSMIC PARTICLES Public/Granted day:2017-08-10
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