Invention Grant
- Patent Title: Image measurement system and controller
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Application No.: US15391022Application Date: 2016-12-27
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Publication No.: US10313569B2Publication Date: 2019-06-04
- Inventor: Gaku Shiramizu , Yuki Taniyasu , Naoya Ochi
- Applicant: OMRON CORPORATION
- Applicant Address: JP Kyoto-shi, Kyoto
- Assignee: OMRON CORPORATION
- Current Assignee: OMRON CORPORATION
- Current Assignee Address: JP Kyoto-shi, Kyoto
- Agency: Sughrue Mion, PLLC
- Priority: JP2016-043191 20160307
- Main IPC: H04N5/225
- IPC: H04N5/225 ; H04N5/232 ; G01B11/25

Abstract:
An image measurement system includes a controller, a projector for emitting illumination light in accordance with a radiation pattern, an imaging unit, and a display unit. The controller includes a display control module for displaying on a display unit an image of a field of view captured by the imaging unit in a state in which illumination light is emitted, a receiving module for receiving a setting of a mask area in association with the image displayed on the display unit, the mask area being an area in which the quantity of illumination light should be reduced compared with another area in the field of view, and an updating module for updating the radiation pattern in accordance with the set mask area, based on a correspondence in position between the radiation pattern of the projector and a projection pattern produced in the field of view by the radiation pattern.
Public/Granted literature
- US20170257540A1 IMAGE MEASUREMENT SYSTEM AND CONTROLLER Public/Granted day:2017-09-07
Information query