Invention Grant
- Patent Title: Method for correcting measuring-point-free temperature compensation model during online application of near infrared spectrum analyzer
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Application No.: US15571033Application Date: 2015-12-04
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Publication No.: US10317280B2Publication Date: 2019-06-11
- Inventor: Xiaoli Luan , Zhonggai Zhao , Fei Liu
- Applicant: Jiangnan University
- Applicant Address: CN Wuxi
- Assignee: JIANGNAN UNIVERSITY
- Current Assignee: JIANGNAN UNIVERSITY
- Current Assignee Address: CN Wuxi
- Agency: IPro, PLLC
- Agent Na Xu
- Priority: CN201510808346 20151119
- International Application: PCT/CN2015/096374 WO 20151204
- International Announcement: WO2017/084118 WO 20170526
- Main IPC: G01N21/359
- IPC: G01N21/359 ; G01J3/02

Abstract:
The present invention relates to a non-direct measurement temperature-compensating model correction method in the on-line application of a near-infrared spectrum analyzer, which comprises: acquiring a near-infrared spectrum of each sample under different temperature levels; respectively carrying out preprocessing and principal component analysis on the acquired spectra for temperatures and to-be-measured physical property parameters; then merging the obtained spectra to generate new spectral data; using partial least squares to model the spectral data to obtain measured values at the current moment; finally, constructing an on-line recursive algorithm, and thereby on-line near-infrared measurement with a non-direct measurement temperature compensation function is fulfilled. The present invention adopts temperature as a separate latent factor variable to participate in the process of near-infrared modeling, so that when near-infrared measurement is used, by depending on the adaptability of a model to the temperature, physical property measurement under different temperatures can be carried out without direct temperature measurement information or related calculation, and thereby the created model has better universality. The on-line recursive algorithm of the present invention has better adaptability to sample temperatures and other measurement condition changes.
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