- Patent Title: Eddy-current flaw detector and eddy-current flaw detection method
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Application No.: US15525527Application Date: 2015-11-10
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Publication No.: US10317367B2Publication Date: 2019-06-11
- Inventor: Noriyasu Kobayashi , Souichi Ueno , Naotaka Suganuma , Tatsuya Oodake , Takeshi Maehara , Takashi Kasuya , Hiroya Ichikawa
- Applicant: KABUSHIKI KAISHA TOSHIBA
- Applicant Address: JP Minato-Ku
- Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee Address: JP Minato-Ku
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2014-231860 20141114
- International Application: PCT/JP2015/081620 WO 20151110
- International Announcement: WO2016/076316 WO 20160519
- Main IPC: G01N27/90
- IPC: G01N27/90 ; G21C17/003

Abstract:
An eddy-current flaw detector includes a trace data calculator configured to calculate each coordinate with respect to flaw detection points on which an inspection probe is used upon performing an eddy-current testing based on an inputted condition of eddy-current flaw detection and surface shape data of an inspection-object surface measured by a profilometer, and to calculate a normal vector of each flaw detection point; a gap evaluation calculator configured to acquire an evaluation result on a gap between the inspection-object surface and the inspection probe for each flaw detection point; a flaw detection data collector configured to acquire flaw detection data of an inspection object for each flaw detection point; a flaw detection data analyzer configured to evaluate presence/absence of a flaw in the inspection-object surface based on the flaw detection data of the inspection object and the evaluation result on the gap for each flaw detection point.
Public/Granted literature
- US20170336361A1 EDDY-CURRENT FLAW DETECTOR AND EDDY-CURRENT FLAW DETECTION METHOD Public/Granted day:2017-11-23
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