Invention Grant
- Patent Title: Semiconductor device, battery monitoring system, and method of monitoring battery
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Application No.: US14798654Application Date: 2015-07-14
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Publication No.: US10320039B2Publication Date: 2019-06-11
- Inventor: Hidekazu Kikuchi
- Applicant: LAPIS SEMICONDUCTOR CO., LTD.
- Applicant Address: JP Kanagawa
- Assignee: LAPIS SEMICONDUCTOR CO., LTD.
- Current Assignee: LAPIS SEMICONDUCTOR CO., LTD.
- Current Assignee Address: JP Kanagawa
- Agency: Kubotera & Associates, LLC
- Priority: JP2014-145250 20140715
- Main IPC: H02J7/00
- IPC: H02J7/00 ; H02J7/14 ; H01M10/48 ; H01M10/44 ; G01R31/3835

Abstract:
A semiconductor device includes a voltage generation circuit configured to generate a specific voltage; a first terminal configured to output the specific voltage; a second terminal configured to receive a temperature sensitive voltage; an analog/digital conversion circuit configured to convert the specific voltage and the temperature sensitive voltage to digital values; a storage unit configured to store the specific voltage and the temperature sensitive voltage; and a third terminal configured to transmit the specific voltage and the temperature sensitive voltage to an external semiconductor device.
Public/Granted literature
- US20160018474A1 SEMICONDUCTOR DEVICE, BATTERY MONITORING SYSTEM, AND METHOD OF MONITORING BATTERY Public/Granted day:2016-01-21
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