Invention Grant
- Patent Title: Nanosheet semiconductor structure with inner spacer formed by oxidation
-
Application No.: US15730306Application Date: 2017-10-11
-
Publication No.: US10332962B2Publication Date: 2019-06-25
- Inventor: Xin Miao , Kangguo Cheng , Chen Zhang , Wenyu Xu
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Ryan, Mason & Lewis, LLP
- Agent L. Jeffrey Kelly
- Main IPC: H01L21/02
- IPC: H01L21/02 ; H01L29/06 ; H01L29/66 ; H01L29/423 ; H01L29/10

Abstract:
A method for fabricating a semiconductor structure includes forming a nanosheet stack on a base. The nanosheet stack comprises one or more first nanosheet layers each comprised of a first material and one or more second nanosheet layers each comprised of a second material different from the first material. The nanosheet stack is recessed. Inner spacers comprising a third material are formed. Forming the inner spacers includes converting the first material corresponding to outer portions of each of the one or more first nanosheet layers into the third material.
Public/Granted literature
- US20190109191A1 NANOSHEET SEMICONDUCTOR STRUCTURE WITH INNER SPACER FORMED BY OXIDATION Public/Granted day:2019-04-11
Information query
IPC分类: